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Meeting	ACGS Committee Meeting 101 - Salt Lake City - March 2008
Agenda Location	6 SUBCOMMITTEE D - DYNAMICS, COMPUTATIONS, AND ANALYSIS 6.3 Seeded Fault Testing and In-situ Analysis of Critical Electronic Components in Electro-Mechanical Actuator Power Circuitry
Title	Seeded Fault Testing and In-situ Analysis of Critical Electronic Components in Electro-Mechanical Actuator Power Circuitry
Presenter	Dave Bodden
Affiliation	Lockheed Martin
Available Downloads*	presentation
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Abstract	An investigation into the development of feasible detection strategies for capturing and trending incipient signs of failure in electronic power and control circuitry of electro-mechanical actuator (EMA) systems was jointly funded and conducted by Lockheed Martin Aeronautics Company, Parker Aerospace, and Impact Technologies, LLC. The objective of the study was to experimentally evaluate feature-based and efficiency-based prognostic approaches for power drive and control electronics through application of component-level highly accelerated life testing (HALT) and circuit board-level seeded fault testing. System-critical components were identified through an Enhanced Failure Modes, Effects and Criticality Analysis (FMECA++). The identified components were then subjected to varying levels of accelerated aging in custom designed aging boards. The aged components were then inserted into the EMA system, and test data acquired. Performing board level tests in this manner provided an opportunity to view the EMA system under varying stages of degradation and develop a prognostic view of failure progression. Component accelerated aging and EMA system testing was performed at Impact’s facility with test system-specific knowledge provided by Lockheed and Parker.